PHI surface analysis equipment

PHI surface analysis equipment

PHI surface analysis equipment can use of polyatomic cluster ion sources such as C60 and Ar2500 for studying organic thin films

Today Physical Electronics (PHI) is the world’s largest supplier of surface analysis instrumentation with a complete product line including; AES, XPS, and TOF-SIMS instruments. PHI surface analysis instruments are used typically to help accelerate the development of new material systems, evaluate new manufacturing processes and determine the root cause of product defects in application areas such as photovoltaics, microelectronics, magnetic media, nanotechnology, metallurgy, tribology, catalyst activity, adhesive bond strength, corrosion resistance, bio-compatibility and printability.

Their PHI 700Xi Scanning Auger Nanoprobe for instance is a unique high performance Auger Electron Spectroscopy (AES) system that provides elemental and chemical state information of sample surfaces from nano-scale features, thin films and interfaces.

The Quantera II, PHI’s unique Scanning XPS Microprobe expands the application of X-ray Photoelectron Spectroscopy (XPS) to a broader range of material problems than was possible with previous generation instruments.

The TRIFT V Time-of-Flight Secondary ion Mass Spectrometer is based on a versatile triple focusing mass spectrometer which provides high performance over a broad range of demanding TOF-SIMS applications including: trace metal detection, identification of organic contaminants, imaging of molecular species, and thin film sputter depth profiling. Recent developments include the use of polyatomic cluster ion sources such as C60 and Ar2500 for studying organic thin films and bio-materials via XPS and TOF-SIMS.

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